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CT-AI Exam Dumps : ISTQBCertified Tester AI Testing Exam

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ISTQBCertified Tester AI Testing Exam Questions and Answers

Question 1

Which ONE of the following hardware is MOST suitable for implementing Al when using ML?

SELECT ONE OPTION

Options:

A.

64-bit CPUs.

B.

Hardware supporting fast matrix multiplication.

C.

High powered CPUs.

D.

Hardware supporting high precision floating point operations.

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Question 2

A startup company has implemented a new facial recognition system for a banking application for mobile devices. The application is intended to learn at run-time on the device to determine if the user should be granted access. It also sends feedback over the Internet to the application developers. The application deployment resulted in continuous restarts of the mobile devices.

Which of the following is the most likely cause of the failure?

Options:

A.

The feedback requires a physical connection and cannot be sent over the Internet

B.

Mobile operating systems cannot process machine learning algorithms

C.

The size of the application is consuming too much of the phone's storage capacity

D.

The training, processing, and diagnostic generation are too computationally intensive for the mobile device hardware to handle

Question 3

There is a growing backlog of unresolved defects for your project. You know the developers have an ML model that they have created which has learned which developers work on which type of software and the speed with which they resolve issues. How could you use this model to help reduce the backlog and implement more efficient defect resolution?

Options:

A.

Use it to prioritize defects automatically based on the time expected for the fix to be made, the speed of the fix, and the likelihood of regressions

B.

Use it to assign defects to the best developer to resolve the problem and to load balance the defect assignments among the developers

C.

Use it to determine the root cause of each defect and develop a process improvement plan that can be implemented to remove the most common root causes

D.

Use it to review the code and determine where more defects are likely to occur so that testing can be targeted to those areas