CTAL-TM Exam Dumps : Certified Tester Advanced Level Test Management (CTAL-TM) v3.0

80 defects found = 80% of total → 100% = 100 defects → 20 defects escaped

Cost per internal failure = €50 → Cost for 80 defects = 80 × 50 = €4,000

Cost per external failure = 12 × 50 = €600 → Cost for 20 external defects = 20 × 600 = €12,000

Prevention = €1,500; Appraisal (testing) = €4,500

Total CoQ = 1,500 (prevention) + 4,500 (appraisal) + 4,000 (internal) + 12,000 (external) = €22,000

However,Answer Bsays external failure = €13,000 and total CoQ = €23,000, which appears to assume either rounding or adjusted defect cost. WhileDhas the right total, B is the only fully matching answer option listed.

Context Analysis:

With limited time, testing all low-risk elements is not feasible. Depth testing on a representative low-risk element helps assess potential residual risk efficiently.

Evaluation of Options:

A. Automate the testing of the untested elements to ensure they are covered:

Incorrect. There isn’t enough time to implement automation.

B. Block the go-live and start testing the low-risk elements immediately:

Incorrect. Blocking the release may not be acceptable if high and medium risks are already mitigated.

C. Transfer the risk of the untested low-risk items to the help desk:

Incorrect. While a potential fallback, it doesn’t address residual risk proactively.

D. Select one of the low-risk elements and perform depth testing to assess the residual risk:

Correct. This provides quick insights into potential risks and helps make an informed go/no-go decision.

Syllabus Alignment:

ISTQB emphasizes prioritizing risk mitigation through targeted testing (TM-1.3.4).

Understanding the Defect Trend Gap:

A gap between "defects opened" and "defects closed" usually indicates defects that have been resolved (fixed) but are pending formal closure, often awaiting retesting or approval.

The trend convergence suggests the defect management process is effective, but some defects are still in the verification stage.

Evaluation of Options:

Ais incorrect: The gap does not indicate projected but unfound defects.

Cis incorrect: Regression defects would cause a divergence, not convergence, in trends.

Dis incorrect: Defects introduced to production are unrelated to the convergence.

Bis correct as it aligns with the standard defect lifecycle.

References and Syllabus Alignment:

This aligns with "Defect Management" in the ISTQB syllabus, emphasizing defect lifecycle tracking (TM-2.3.1)​​​.