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CTAL-TM Exam Dumps : Certified Tester Advanced Level Test Management (CTAL-TM) v3.0

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Certified Tester Advanced Level Test Management (CTAL-TM) v3.0 Questions and Answers

Question 1

In what environment are you most likely to see multiple defect management systems used in one project?

Options:

A.

Sequential

B.

Agile

C.

Hybrid

D.

Multi-tenant

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Question 2

Your team has been given the following test objective Ensure that the users are happier with this version than they were with the last version?

What is wrong with the way this is defined?

Options:

A.

It is unlikely that just a version change will make users happier so this is not achievable

B.

It cannot be measured because happier' is subjective

C.

It does not define a timeframe

D.

It is not aligned with the organization's objectives

Question 3

You are a Test Manager at a company that develops mobile phone applications. Based on historical data in your company, you have calculated the following average metrics for system testing:

• for each 100 LOC (Lines Of Code). 4 test cases are executed

• each test case takes on average 15 minutes to execute and check

• for each 1000 LOC, 5 defects are found

You have used this information to create an estimate for the system testing of a new mobile phone application being developed to submit gas and electricity readings.

The application delivered for system testing has 50.000 lines of code. At the end of system testing, 250 defects are discovered.

Assume that:

• the system test of the new mobile phone application will require the same amount of effort as previous applications

• defect density = number of defects/1000 LOC

• no new tools or processes have been introduced to the test team

Based only on the given information, which one of the following statements is true about this new mobile phone application?

SELECT ONE OPTION

Options:

A.

The time taken to run all the estimated tests would be 750 hours.

B.

3000 test cases will be executed during system testing and 250 defects will be found.

C.

The actual number of defects found is the same as the estimated number of defects.

D.

The source code contains a lower defect density than the source code of past applications