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Nokia 4A0-265 Exam With Confidence Using Practice Dumps

Exam Code:
4A0-265
Exam Name:
Nokia Optical Diagnostics and Troubleshooting Exam
Certification:
Vendor:
Questions:
40
Last Updated:
Dec 12, 2024
Exam Status:
Stable
Nokia 4A0-265

4A0-265: Nokia Certification Exam 2024 Study Guide Pdf and Test Engine

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Nokia Optical Diagnostics and Troubleshooting Exam Questions and Answers

Question 1

Consider the exhibit. What do the different colored green columns indicate?

Options:

A.

Optical power levels measured multiple times against a specific interface, at 24-hour intervals for the same wavelength.

B.

Optical power levels measured for multiple wavelengths against a specific interface.

C.

Optical power levels measured at different interfaces throughout the optical path of a single wavelength.

D.

The average optical power levels measured for multiple wavelengths throughout their shared optical path.

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Question 2

Which of the following statements about 1-Day PMs is TRUE?

Options:

A.

1-Day PMs show measurements collected over the preceding 24 hours. Up to 8 bins are available for data storing.

B.

1-Day PMs show measurements collected since the beginning of the current day. Up to 8 bins are available for data storing.

C.

1-Day PMs show measurements collected over the preceding 24 hours. Up to 33 bins are available for data storing.

D.

1-Day PMs show measurements collected since the beginning of the current day. Up to 33 bins are available for data storing.

Question 3

Which of the following statements best describes the output of the command: show xc 1?

Options:

A.

OCH trail name, ITU channel, administrative/operational states, protection states, and Wave Keys for both directions.

B.

A list of cross-connections, including A-end, Z-end, frequency, ID number, OCH trail name, and administrative/operational states.

C.

A list of boards that this cross-connection passes through on the local node, along with administrative/operational states, expected power levels, and measured power levels.

D.

A list of all boards on all nodes that this cross-connection passes through, along with expected power levels, measured power levels, and allowed power deviations.